%0 Journal Article
%B Microelectronics Reliability
%D 2009
%R https://doi.org/10.1016/j.microrel.2008.10.017
%T Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity
%U https://www.sciencedirect.com/science/article/pii/S0026271408004083
%V 49
%9 Journal Article