@article{415,
  author = {V. Born and M. Beck and O. Bosholm and D. Dalleau and S. Glenz and I. Haverkamp and G. Kurz and F. Lange and Anja Vest},
  title = {Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity},
  year = {2009},
  booktitle = {Microelectronics Reliability},
  journal = {Microelectronics Reliability},
  volume = {49},
  number = {1},
  issn = {0026-2714},
  url = {https://www.sciencedirect.com/science/article/pii/S0026271408004083},
  doi = {https://doi.org/10.1016/j.microrel.2008.10.017},
}